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CMOS-circuit degradation analysis using optical measurement of the substrate current

โœ Scribed by Romano, G.; Sampietro, M.

Book ID
114536807
Publisher
IEEE
Year
1997
Tongue
English
Weight
75 KB
Volume
44
Category
Article
ISSN
0018-9383

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โœ Keiko Makie-Fukuda; Takanobu Anbo; Toshiro Tsukada ๐Ÿ“‚ Article ๐Ÿ“… 1998 ๐Ÿ› John Wiley and Sons ๐ŸŒ English โš– 175 KB

It is important to reduce substrate noise in the analog/digital mixed-signal integrated circuits. In order to understand the influence of substrate noise, a technique to measure substrate noise using a chopper-type voltage comparator based on an equivalent sampling method is proposed. The substrate