Degradation Analysis of 2-μm DFB Laser Using Optical Beam-Induced Current Technique

✍ Scribed by Takeshita, T.; Sato, T.; Mitsuhara, M.; Kondo, Y.; Sugo, M.; Kato, K.

• Book ID: 114618922
• Publisher: IEEE
• Year: 2007
• Tongue: English
• Weight: 477 KB
• Volume: 54
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/ted.2007.904961