Practical accuracy analysis of some existing effective channel length and series resistance extraction methods for MOSFET's

✍ Scribed by Biesemans, S.; Hendriks, M.; Kubicek, S.; De Meyer, K.

• Book ID: 114537299
• Publisher: IEEE
• Year: 1998
• Tongue: English
• Weight: 263 KB
• Volume: 45
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/16.678555