Power-Constrained Testing Of Vlsi Circuits

✍ Scribed by Richard J. Peterson

Publisher: McGraw-Hill Companies
Year: 2000
Tongue: English
Leaves: 191
Series: Frontiers in Electronic Testing
Edition: 1st
Category: Library

No coin nor oath required. For personal study only.

✦ Synopsis

This book focuses on techniques for minimizing power dissipation during test application at logic and register-transfer levels of abstraction of the very large scale integrated (VLSI) design flow. After a survey of existing techniques for power constrained testing of VLSI circuits, several test automation techniques are presented for reducing power in scan-based sequential circuits and BIST data paths. Nicolici is affiliated with McMaster University, Canada. Al-Hashimi is affiliated with the University of Southampton, UK.

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