𝔖 Bobbio Scriptorium

✦ LIBER ✦

Potential distribution in a rectangular semiconductor bar for use with four-point probe measurements

✍ Scribed by J.Marshall Reber

Publisher: Elsevier Science
Year: 1964
Tongue: English
Weight: 351 KB
Volume: 7
Category: Article
ISSN: 0038-1101
DOI: 10.1016/0038-1101(64)90089-9

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Semiconductor and semi-insulator resisti

Semiconductor and semi-insulator resistivity measurements using a direct current four point probe apparatus with non-penetrating tips

✍ K. Heilig 📂 Article 📅 1973 🏛 Elsevier Science 🌐 English ⚖ 343 KB

Influence of discontinuous resistivity d

Influence of discontinuous resistivity distribution in semiconductor wafers on the results of measurements with a four-point probe method : J. Marciak-Kozlowska and S. Sikorski. Electron Technol. Warsaw9 (2) 3 (1976)

📂 Article 📅 1977 🏛 Elsevier Science 🌐 English ⚖ 132 KB

Semiconductor and semi-insulator resisti

Semiconductor and semi-insulator resistivity measurements using a direct current four-point probe apparatus with non-penetrating tips : K. Heilig. Solid St. Electron.16 (1973), p. 503

📂 Article 📅 1973 🏛 Elsevier Science 🌐 English ⚖ 104 KB