✦ LIBER ✦
Influence of discontinuous resistivity distribution in semiconductor wafers on the results of measurements with a four-point probe method : J. Marciak-Kozlowska and S. Sikorski. Electron Technol. Warsaw9 (2) 3 (1976)
- Publisher
- Elsevier Science
- Year
- 1977
- Tongue
- English
- Weight
- 132 KB
- Volume
- 16
- Category
- Article
- ISSN
- 0026-2714
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