Semiconductor and semi-insulator resistivity measurements using a direct current four point probe apparatus with non-penetrating tips

✍ Scribed by K. Heilig

• Publisher: Elsevier Science
• Year: 1973
• Tongue: English
• Weight: 343 KB
• Volume: 16
• Category: Article
• ISSN: 0038-1101
• DOI: 10.1016/0038-1101(73)90189-5