Post-Irradiation Annealing Mechanisms of Defects Generated in Hydrogenated Bipolar Oxides

✍ Scribed by Chen, X. Jie; Barnaby, Hugh J.; Vermeire, Bert; Holbert, Keith E.; Wright, David; Pease, Ronald L.; Schrimpf, Ronald D.; Fleetwood, Daniel M.; Pantelides, Sokrates T.; Shaneyfelt, Marty R.; Adell, Philippe

• Book ID: 120524676
• Publisher: IEEE
• Year: 2008
• Tongue: English
• Weight: 345 KB
• Volume: 55
• Category: Article
• ISSN: 0018-9499
• DOI: 10.1109/TNS.2008.2006972