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Post-deposition relaxation of internal stress in sputter-grown HfN thin films bombarded with carbon ions

โœ Scribed by R Nowak; F Yoshida; Y Miyagawa; S Miyagawa


Book ID
114170784
Publisher
Elsevier Science
Year
1999
Tongue
English
Weight
201 KB
Volume
148
Category
Article
ISSN
0168-583X

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