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Post-annealing effect of YIG ferrite thin-films epitaxially grown by reactive sputtering

✍ Scribed by Yamamoto, Setsuo ;Kuniki, Hirofumi ;Kurisu, Hiroki ;Matsuura, Mitsuru ;Jang, Pyungwoo

Book ID
105361983
Publisher
John Wiley and Sons
Year
2004
Tongue
English
Weight
188 KB
Volume
201
Category
Article
ISSN
0031-8965

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Thin films of CN x were deposited by reactive r.f.-magnetron sputtering on Si(100) substrates. The effect of annealing temperatures on the structural properties of the films has been studied by Fourier transform infrared (FTIR) spectroscopy, x-ray photoelectron spectroscopy (XPS) and transmission el