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Positive temperature coefficient of impact ionization in strained-Si

โœ Scribed by Waldron, N.S.; Pitera, A.J.; Lee, M.L.; Fitzgerald, E.A.; del Alamo, J.A.


Book ID
114617851
Publisher
IEEE
Year
2005
Tongue
English
Weight
412 KB
Volume
52
Category
Article
ISSN
0018-9383

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