Extension of impact-ionization multiplication coefficient measurements to high electric fields in advanced Si BJT's

✍ Scribed by Zanoni, E.; Crabbe, E.F.; Stork, J.M.C.; Pavan, P.; Verzellesi, G.; Vendrame, L.; Canali, C.

• Book ID: 125430157
• Publisher: IEEE
• Year: 1993
• Tongue: English
• Weight: 307 KB
• Volume: 14
• Category: Article
• ISSN: 0741-3106
• DOI: 10.1109/55.215111