Prediction of impact-ionization-induced snap-back in advanced Si n-p-n BJT's by means of a nonlocal analytical model for the avalanche multiplication factor

✍ Scribed by Verzellesi, G.; Baccarani, G.; Canali, C.; Pavan, P.; Vendrame, L.; Zanoni, E.

• Book ID: 114535474
• Publisher: IEEE
• Year: 1993
• Tongue: English
• Weight: 474 KB
• Volume: 40
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/16.249478