๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

Polymer Analysis and Characterization by FTIR, FTIR-Microscopy, Raman Spectroscopy and Chemometrics

โœ Scribed by Chalmers, John M.; Everall, Neil J.


Book ID
121512946
Publisher
Taylor and Francis Group
Year
1999
Tongue
English
Weight
1008 KB
Volume
5
Category
Article
ISSN
1023-666X

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Chemical characterization of SiCxNy nano
โœ O. Baake; N.I. Fainer; P. Hoffmann; M.L. Kosinova; Yu.M. Rumyantsev; V.A. Trunov ๐Ÿ“‚ Article ๐Ÿ“… 2009 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 357 KB

## SiC x N y nanolayers were synthesized by a remote plasma enhanced chemical vapour deposition (RPECVD) method and chemically characterized by Fourier transform infrared spectroscopy (FTIR), Raman spectroscopy, X-ray photoelectron spectroscopy (XPS), and near-edge X-ray absorption fine structure