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Characterization of multilayer polymer structures by micro-raman and micro-FTIR spectroscopies

✍ Scribed by T. Jawhari; J.M. Pastor


Publisher
Elsevier Science
Year
1992
Tongue
English
Weight
532 KB
Volume
266
Category
Article
ISSN
0022-2860

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Depth Profiling by AFM Nanoindentations
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## Abstract **Summary:** A method of depth profiling by AFM nanoindentations is developed for the characterisation of the heterogeneity of the mechanical properties of oxidised polymers. An increase or a decrease of the sample stiffness is measured close to the surface. A comparison with micro‐FTIR