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Plane-strain bulge test for nanocrystalline copper thin films

✍ Scribed by Xiaoding Wei; Dongyun Lee; Sanghoon Shim; Xi Chen; Jeffrey W. Kysar

Book ID
113896779
Publisher
Elsevier Science
Year
2007
Tongue
English
Weight
413 KB
Volume
57
Category
Article
ISSN
1359-6462

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