Comparison of tensile and bulge tests fo
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R. L. Edwards; G. Coles; W. N. Sharpe
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Article
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2004
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Sage Publications
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English
β 762 KB
The mechanical properties of thin-film, lowpressure chemical vapor deposited silicon nitride were measured in uniaxial tension and by a bulge test method suitable for wafer-level testing. This research compares the two approaches and presents additional data on silicon nitride. The common property f