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Comparison of tensile and bulge tests for thin-film silicon nitride

✍ Scribed by R. L. Edwards; G. Coles; W. N. Sharpe


Book ID
105569940
Publisher
Sage Publications
Year
2004
Tongue
English
Weight
762 KB
Volume
44
Category
Article
ISSN
0014-4851

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Comparison of tensile and bulge tests fo
✍ R. L. Edwards; G. Coles; W. N. Sharpe πŸ“‚ Article πŸ“… 2004 πŸ› Sage Publications 🌐 English βš– 762 KB

The mechanical properties of thin-film, lowpressure chemical vapor deposited silicon nitride were measured in uniaxial tension and by a bulge test method suitable for wafer-level testing. This research compares the two approaches and presents additional data on silicon nitride. The common property f