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Measuring stiffnesses and residual stresses of silicon nitride thin films

✍ Scribed by S. Hong; T. P. Weihs; J. C. Bravman; W. D. Nix


Book ID
112812566
Publisher
Springer US
Year
1990
Tongue
English
Weight
711 KB
Volume
19
Category
Article
ISSN
0361-5235

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