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Piezoscopic deep-level transient spectroscopy studies of the silicon divacancy

✍ Scribed by Dobaczewski, L.; Gościński, K.; Żytkiewicz, Z. R.; Nielsen, K. Bonde; Rubaldo, L.; Andersen, O.; Peaker, A. R.


Book ID
120429622
Publisher
The American Physical Society
Year
2002
Tongue
English
Weight
88 KB
Volume
65
Category
Article
ISSN
1098-0121

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