Piezoelectric Photothermal and Surface Photo-Voltage Studies of Carrier Recombination Mechanism at Interface of Si p – n Junction

✍ Scribed by Uchibori, Yuki; Chuman, Hiroki; Hayashi, Hiromitsu; Sonoda, Shusei; Wang, Ping; Fukuyama, Atsuhiko; Ikari, Tetsuo

• Book ID: 125492080
• Publisher: Institute of Pure and Applied Physics
• Year: 2007
• Tongue: English
• Weight: 258 KB
• Volume: 46
• Category: Article
• ISSN: 0021-4922
• DOI: 10.1143/JJAP.46.4636