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Physically rigorous modeling of internal laser-probing techniques for microstructured semiconductor devices

✍ Scribed by Thalhammer, R.K.; Wachutka, G.K.M.

Book ID: 118698469
Publisher: IEEE
Year: 2004
Tongue: English
Weight: 859 KB
Volume: 23
Category: Article
ISSN: 0278-0070
DOI: 10.1109/tcad.2003.819895

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