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Photoluminescence and X-ray diffraction study of highly uniform silicon and GexSi1−x epitaxial layers

✍ Scribed by D.W. Greve; R. Misra; T.E. Schlesinger; G. McLaughlin; M.A. Capano

Publisher: Elsevier Science
Year: 1992
Tongue: English
Weight: 566 KB
Volume: 222
Category: Article
ISSN: 0040-6090
DOI: 10.1016/0040-6090(92)90036-b

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