Photoluminescence and Raman scattering s
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Koichi Inoue; Kenzo Maehashi; Hisao Nakashima; Osamu Matsuda; Kazuo Murase
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Article
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1992
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Elsevier Science
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English
โ 316 KB
Depth profiles of photoluminescence (PL) and Raman scattering properties of anodized porous Si have been studied by micro-measurement techniques. The depthstructural-inhomogeneity strongly affects the optical properties of porous Si. The Si 2p absorption edge of porous Si has been examined with sync