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Photoconduction and trapping in sputtered tantalium oxide films

โœ Scribed by Frank G. Ullman


Publisher
Elsevier Science
Year
1966
Tongue
English
Weight
129 KB
Volume
4
Category
Article
ISSN
0038-1098

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The trap levels in CdS thin films prepared by rf magnetron sputtering have been investigated using Photoinduced Current Transient Spectroscopy (PICTS). Trap levels in the range 0.08-1.06 eV have been detected. Those levels are tentatively attributed to native defects and foreign impurities (particul