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Phase uncertainty in calibrating microwave test fixtures

✍ Scribed by Ning Hua Zhu


Book ID
114553513
Publisher
IEEE
Year
1999
Tongue
English
Weight
164 KB
Volume
47
Category
Article
ISSN
0018-9480

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New algorithms of the TSM and TOM method
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## Abstract Based on the conventional through‐short‐match (TSM) method, an improved TSM method has been proposed in this Letter. This method gives an analytical solution and has almost all the advantages of conventional TSM methods. For example, it has no phase uncertainty and no bandwidth limitati