New algorithms of the TSM and TOM methods for calibrating microwave test fixtures

✍ Scribed by Ning Hua Zhu; Zhen Yu Chen; You Lin Wang

• Publisher: John Wiley and Sons
• Year: 2002
• Tongue: English
• Weight: 245 KB
• Volume: 34
• Category: Article
• ISSN: 0895-2477
• DOI: 10.1002/mop.10363

✦ Synopsis

Abstract

Based on the conventional through‐short‐match (TSM) method, an improved TSM method has been proposed in this Letter. This method gives an analytical solution and has almost all the advantages of conventional TSM methods. For example, it has no phase uncertainty and no bandwidth limitation. The experimental results show that the accuracy can be significantly improved with this method. The proposed theory can be applied to the through‐open‐match (TOM) method. © 2002 Wiley Periodicals, Inc. Microwave Opt Technol Lett 34: 26–31, 2002; Published online in Wiley InterScience (www.interscience.wiley.com). DOI 10.1002/mop.10363