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Frequency limitation in the calibration of microwave test fixtures

✍ Scribed by Ning Hua Zhu; Chen Qian; You Lin Wang; Pun, E.Y.B.; Po-Shuen Chung


Book ID
114659855
Publisher
IEEE
Year
2003
Tongue
English
Weight
470 KB
Volume
51
Category
Article
ISSN
0018-9480

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New algorithms of the TSM and TOM method
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## Abstract Based on the conventional through‐short‐match (TSM) method, an improved TSM method has been proposed in this Letter. This method gives an analytical solution and has almost all the advantages of conventional TSM methods. For example, it has no phase uncertainty and no bandwidth limitati