𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Phase suppression in the transient stages of interdiffusion in thin films

✍ Scribed by D.S. Williams; R.A. Rapp; J.P. Hirth


Book ID
103427848
Publisher
Elsevier Science
Year
1986
Tongue
English
Weight
911 KB
Volume
142
Category
Article
ISSN
0040-6090

No coin nor oath required. For personal study only.


πŸ“œ SIMILAR VOLUMES


Investigation of interdiffusion in coppe
✍ Ahmed M. Abdul-Lettif πŸ“‚ Article πŸ“… 2007 πŸ› Elsevier Science 🌐 English βš– 186 KB

Auger depth profiling technique and X-ray diffraction analysis have been employed to study the interdiffusion in vacuum-deposited copper-nickel bilayer thin films. An adaptation of the Whipple model was used to determine the diffusion coefficients of both nickel in copper and copper in nickel. The c