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Phase conjugate interferometric measurement of thin film parameters

✍ Scribed by Cronin-Golomb, Mark ;Shamir, Joseph

Book ID: 115340552
Publisher: The Optical Society
Year: 1989
Tongue: English
Weight: 461 KB
Volume: 28
Category: Article
ISSN: 1559-128X
DOI: 10.1364/AO.28.005196

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