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Perovskite oxynitride LaTiOxNy thin films: Dielectric characterization in low and high frequencies

✍ Scribed by Y. Lu; A. Ziani; C. Le Paven-Thivet; R. Benzerga; L. Le Gendre; D. Fasquelle; H. Kassem; F. Tessier; V. Vigneras; J.-C. Carru; A. Sharaiha

Book ID: 113936894
Publisher: Elsevier Science
Year: 2011
Tongue: English
Weight: 844 KB
Volume: 520
Category: Article
ISSN: 0040-6090
DOI: 10.1016/j.tsf.2011.01.226

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