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Permittivity determination using amplitudes of transmission and reflection coefficients at microwave frequency

✍ Scribed by Zhihong Ma; Okamura, S.


Book ID
114553429
Publisher
IEEE
Year
1999
Tongue
English
Weight
190 KB
Volume
47
Category
Article
ISSN
0018-9480

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## Abstract For in situ measurement of the complex permittivity of planar materials, a free‐space system based on reflection or transmission ellipsometry has been developed and extended to microwave frequencies. Different angles of incidence were studied in the range [35–50Β°]. Original numerical me