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Determination of the reflection coefficient and permittivity of thin cylindrical dielectric and semiconductor specimens at microwave frequencies

✍ Scribed by I. P. Grigas; V. K. Shugurov

Book ID: 112462823
Publisher: Springer US
Year: 1969
Tongue: English
Weight: 243 KB
Volume: 12
Category: Article
ISSN: 0033-8443
DOI: 10.1007/bf01031288

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