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Permanent Damage Effects in Si and AlGaAs/GaAs Photodiodes

✍ Scribed by Wiczer, J. J.; Dawson, L. R.; Osbourn, G. C.; Barnes, C. E.

Book ID: 114662454
Publisher: IEEE
Year: 1982
Tongue: English
Weight: 771 KB
Volume: 29
Category: Article
ISSN: 0018-9499
DOI: 10.1109/tns.1982.4336400

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