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Drain current dlts analysis of recoverable and permanent degradation effects in AlGaAs/GaAs AND AlGaAs/InGaAs HEMT'S

✍ Scribed by G. Meneghesso; Y. Haddab; N. Perrino; C. Canali; E. Zanoni


Publisher
Elsevier Science
Year
1996
Tongue
English
Weight
290 KB
Volume
36
Category
Article
ISSN
0026-2714

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