๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

Performance of low-loss RF MEMS capacitive switches

โœ Scribed by Goldsmith, C.L.; Zhimin Yao, ; Eshelman, S.; Denniston, D.


Book ID
119947568
Publisher
IEEE
Year
1998
Tongue
English
Weight
166 KB
Volume
8
Category
Article
ISSN
1051-8207

No coin nor oath required. For personal study only.


๐Ÿ“œ SIMILAR VOLUMES


Reliability of capacitive RF MEMS switch
โœ Yong Zhu; Horacio D. Espinosa ๐Ÿ“‚ Article ๐Ÿ“… 2004 ๐Ÿ› John Wiley and Sons ๐ŸŒ English โš– 305 KB

Some applications of RF MEMS switches, such as aircraft condition monitoring and distributed satellite communication, present a unique challenge for device design and reliability. This article examines these switches when operational temperatures in the range ุŠ60ยฐC to 100ยฐC are envisioned. The basic

ESD failure signature in capacitive RF M
โœ Ruan, J.; Papaioannou, G.J.; Nolhier, N.; Mauran, N.; Bafleur, M.; Coccetti, F.; ๐Ÿ“‚ Article ๐Ÿ“… 2008 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 737 KB