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ESD failure signature in capacitive RF MEMS switches

✍ Scribed by Ruan, J.; Papaioannou, G.J.; Nolhier, N.; Mauran, N.; Bafleur, M.; Coccetti, F.; Plana, R.

Book ID: 108210765
Publisher: Elsevier Science
Year: 2008
Tongue: English
Weight: 737 KB
Volume: 48
Category: Article
ISSN: 0026-2714
DOI: 10.1016/j.microrel.2008.06.035

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