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Performance of a time-of-flight spectrometer for thin film analysis by medium energy ion scattering

✍ Scribed by Marcus H. Mendenhall; Robert A. Weller

Book ID: 113280487
Publisher: Elsevier Science
Year: 1990
Tongue: English
Weight: 1017 KB
Volume: 47
Category: Article
ISSN: 0168-583X
DOI: 10.1016/0168-583x(90)90029-t

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