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Peculiarities of Formation and Annealing of VO-Related Defects in Ge Doped with Tin

✍ Scribed by Khirunenko, Lyudmila I.; Pomozov, Yurii V.; Sosnin, Mikhail G.; Abrosimov, Nikolay V.; Riemann, H.


Book ID
121271903
Publisher
Trans Tech Publications, Ltd.
Year
2011
Tongue
English
Weight
347 KB
Volume
178-179
Category
Article
ISSN
1662-9779

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