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Peculiarities in the X-ray Spectral Microanalysis of the SnTeI System

✍ Scribed by Dr. R. Assenov; V. Moshnikov; B. Patarov; D. Yaskov


Publisher
John Wiley and Sons
Year
1986
Tongue
English
Weight
245 KB
Volume
21
Category
Article
ISSN
0232-1300

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✦ Synopsis


Peculiarities in the X-ray Spectral Microanalysis of the Sn-TeI System

This is an examination of the methodological specificities of the roentgenospectral microanalysis of the Sn-Te-I system, involving the application of a graphoanalytical method used in the analysis of ternary systems according to data calculated for the binary ones. The calculations were made on an ES 1060 computer in FORTRAN-4. The calculations are for different selection angles of the microanalyzer, and for a broad interval of values of the accelerating voltage. I n this manner the method offered is applicable to any type of microanalyzer, and not only to the Cameca MS-46 used by us.


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