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The effect of aluminium coating on elemental signals in X-ray microanalysis

โœ Scribed by A. P. Reid; K. Oates; W. T. W. Potts

Publisher
John Wiley and Sons
Year
1993
Tongue
English
Weight
432 KB
Volume
24
Category
Article
ISSN
1059-910X

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โœฆ Synopsis

It has been determined that, in the normal range of aluminium coating thicknesses used to remove charge from non-conducting specimens in the electron microscope, no detectable influence on the elemental signals obtained in X-ray microanalysis is observed. This is in contrast to a previous report (Hopkins et al., J. Electron Microsc. Tech., 18:176-182, 1991) of a reduction in elemental signal with increasing aluminium coating thickness. An explanation of

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