An analytical expression for the characteristic line intensity of the x-rays emitted by a probe when bombarded by an electron beam is obtained using the Pontriaguin method. This method is applied to a simple model which is brieΓy described.
Application of the invariant embedding method to x-ray microanalysis
β Scribed by Silvia P. Heluani; C. Hoffmann
- Publisher
- John Wiley and Sons
- Year
- 1998
- Tongue
- English
- Weight
- 209 KB
- Volume
- 27
- Category
- Article
- ISSN
- 0049-8246
No coin nor oath required. For personal study only.
β¦ Synopsis
The invariant embedding principle was applied to obtain closed analytical expressions of several magnitudes of interest in electron probe microanalysis [ ionization distribution function, /(qz) backscattering probability, etc. ] . This approach permits one easily to obtain solutions for a model which explicitly considers the mean free path between e β ective electron collisions.
π SIMILAR VOLUMES
In the framework of a large research programme on air quality in northern Italy managed by the Institute of General and Applied Physics (IFGA), an extensive investigation of air particle pollution was performed. Aerosol sampling campaigns were carried out in areas of di β erent typology in the Po Val