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Pattern Center Determination in Electron Backscatter Diffraction Microscopy

✍ Scribed by Basinger, Jay; Fullwood, David; Kacher, Josh; Adams, Brent

Book ID
120038509
Publisher
Cambridge University Press
Year
2011
Tongue
English
Weight
760 KB
Volume
17
Category
Article
ISSN
1431-9276

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Combining electron backscatter diffraction (EBSD), a scanning electron microscope (SEM) and a focused ion beam (FIB) together into a single instrument enables three dimensional (3D) characterization of microstructure in crystalline materials. Combining these techniques together has enormous potentia