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Determination of a mean orientation in electron backscatter diffraction measurements

โœ Scribed by Jae-Hyung Cho; A. D. Rollett; K. H. Oh

Book ID
107440713
Publisher
The Minerals, Metals & Materials Society
Year
2005
Tongue
English
Weight
751 KB
Volume
36
Category
Article
ISSN
1073-5623

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โœ Stuart I. Wright; Stefan Zaefferer ๐Ÿ“‚ Article ๐Ÿ“… 2007 ๐Ÿ› Wiley (John Wiley & Sons) โš– 468 KB

Combining electron backscatter diffraction (EBSD), a scanning electron microscope (SEM) and a focused ion beam (FIB) together into a single instrument enables three dimensional (3D) characterization of microstructure in crystalline materials. Combining these techniques together has enormous potentia