๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

A Comparison of Textures Measured Using X-Ray and Electron Backscatter Diffraction

โœ Scribed by Stuart I. Wright; Matthew M. Nowell; John F. Bingert


Book ID
107441437
Publisher
The Minerals, Metals & Materials Society
Year
2007
Tongue
English
Weight
628 KB
Volume
38
Category
Article
ISSN
1073-5623

No coin nor oath required. For personal study only.


๐Ÿ“œ SIMILAR VOLUMES


A Comparison of Rutherford Backscatterin
โœ S. Srinivasan; R. Liu; F. Bertram; F.A. Ponce; S. Tanaka; H. Omiya; Y. Nakagawa ๐Ÿ“‚ Article ๐Ÿ“… 2001 ๐Ÿ› John Wiley and Sons ๐ŸŒ English โš– 88 KB

In this paper, we report the measurements of indium composition of thick InGaN epilayers by X-ray diffraction (XRD) and Rutherford backscattering spectroscopy (RBS). In order to account for the biaxial stress in the InGaN epilayers, we determined both a and c lattice parameters in a q/2q scan. Indiu