𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Comparison of kinematic X-ray diffraction and backscattering spectrometry — strain and damage profiles in garnet

✍ Scribed by B.M. Paine; V.S. Speriosu; L.S. Wieluński; H.L. Glass; M.A. Nicolet


Publisher
Elsevier Science
Year
1981
Weight
478 KB
Volume
191
Category
Article
ISSN
0167-5087

No coin nor oath required. For personal study only.


📜 SIMILAR VOLUMES


Comparison of shallow depth profiles of
✍ Klockenkämper, R.; von Bohlen, A.; Becker, H. W.; Palmetshofer, L. 📂 Article 📅 1999 🏛 John Wiley and Sons 🌐 English ⚖ 94 KB 👁 2 views

Thin and shallow layers of some 50-150 nm were produced by ion implantation of Co ions in Si wafers and afterwards characterized by concentration-depth profiling. Two methods were applied for that purpose: a novel method combining a stepwise wet-chemical etching of an implanted wafer with total refl