Parameter Extraction of Nano-Scale MOSFET by a Forward Gated-Diode Method

✍ Scribed by Zhang, Chenfei; Shi, Min; Zhang, Zhenjuan; Sun, Lin; Wang, Qiang; Ma, Chenyue; Guo, Xinjie; Zhang, Xiufang; He, Jin; Chen, Qin; Ye, Yun; Ma, Yong; Wang, Ruonan; Wang, Hao

• Book ID: 115535247
• Publisher: American Scientific Publishers
• Year: 2012
• Tongue: English
• Weight: 245 KB
• Volume: 9
• Category: Article
• ISSN: 1546-1955
• DOI: 10.1166/jctn.2012.2248