Package for development of embedded systems
- Publisher
- Elsevier Science
- Year
- 1989
- Tongue
- English
- Weight
- 101 KB
- Volume
- 31
- Category
- Article
- ISSN
- 0950-5849
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## Abstract Device characterization hinges on precise measurements of the device under test (DUT). When it cannot be probed directly, mount the package to a PCB fixture. While this makes measurement easy, separating the effects of the DUT from the PCB carrier can be difficult. This paper illustrate
The modified embedded atom method is tested in the atomistic simulations of binary fcc metallic alloys. As an example the alloying behaviour of Cu-Ag is studied using the molecular dynamics (MD) method. The MD algorithms that we use are based on the extended Hamiltonian formalism and the ordinary ex
## Abstract Β© 2002 Wiley Periodicals, Inc. Microwave Opt Technol Lett 34: 322, 2002; Published online in Wiley InterScience (www.interscience.wiley.com). DOI 10.1002/mop.10681