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Comments on “de-embedding PCB fixtures for package characterization”

✍ Scribed by Kimmo Silvonen

Publisher
John Wiley and Sons
Year
2002
Tongue
English
Weight
60 KB
Volume
34
Category
Article
ISSN
0895-2477

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✦ Synopsis

Abstract

© 2002 Wiley Periodicals, Inc. Microwave Opt Technol Lett 34: 322, 2002; Published online in Wiley InterScience (www.interscience.wiley.com). DOI 10.1002/mop.10681

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De-embedding PCB fixtures for package ch
De-embedding PCB fixtures for package characterization
✍ Scott A. Wartenberg; Phillip Grajek 📂 Article 📅 2001 🏛 John Wiley and Sons 🌐 English ⚖ 98 KB

## Abstract Device characterization hinges on precise measurements of the device under test (DUT). When it cannot be probed directly, mount the package to a PCB fixture. While this makes measurement easy, separating the effects of the DUT from the PCB carrier can be difficult. This paper illustrate