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Ozone-exposure and annealing effects on graphene-on-SiO2 transistors

✍ Scribed by Zhang, E. X.; Newaz, A. K. M.; Wang, B.; Zhang, C. X.; Fleetwood, D. M.; Bolotin, K. I.; Schrimpf, R. D.; Pantelides, S. T.; Alles, M. L.

Book ID: 115468653
Publisher: American Institute of Physics
Year: 2012
Tongue: English
Weight: 916 KB
Volume: 101
Category: Article
ISSN: 0003-6951
DOI: 10.1063/1.4753817

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