Oxygen diffusion in c-axis oriented Y1Ba2Cu3O7âδ thin films
✍ Scribed by Mori, Zon; Doi, Toshiya; Hakuraku, Yoshinori
- Book ID
- 120046482
- Publisher
- American Institute of Physics
- Year
- 2011
- Tongue
- English
- Weight
- 675 KB
- Volume
- 110
- Category
- Article
- ISSN
- 0021-8979
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A systematic study of the flux creep behavior has been carried out for c-axis oriented epitaxial YBa2Cu307 thin films based on the Anderson and Kim flux creep model. In a wide magnetic field (H) range (0 to 12 T) and temperature (T) range ( 10 to 82 K), the behavior of the critical current density J
The critical current densities across grain boundaries have been measured as a fonction of the in-plane crystallographic orientations of c-axis Y1Ba2Cu307 thin films grown on different lattice-mismatched substrates by inverted-cylindrical-magnetron sputtering technique. The in-plane orientation of t